Testable design is a design-for-testability (DFT) technique that makes digital systems more testable by incorporating specific design features. The primary goals of testable design are:
10–100× reduction in test data volume and test time.
High-quality solutions in this field rely on two fundamental concepts: and controllability . By maximizing these, engineers can drastically reduce the complexity of test generation for advanced sequential circuits, effectively transforming them into simpler combinational problems.
: Strategies like Scan Design and Boundary Scan that make internal circuit states more observable and controllable.